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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
7266235
Issue Dt:
09/04/2007
Application #:
09986577
Filing Dt:
11/09/2001
Publication #:
20020057831
Pub Dt:
05/16/2002
Inventors:
Takashi Hiroi, Masahiro Watanabe, Chie Shishido, Aritoshi Sugimoto, Maki Tanaka et al
Title:
PATTERN INSPECTION METHOD AND APPARATUS
Assignment: 1
Reel/Frame:
012303/0366Recorded: 11/09/2001Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
HIROI, TAKASHI
Exec Dt:
10/15/2001
WATANABE, MASAHIRO
Exec Dt:
10/15/2001
SHISHIDO, CHIE
Exec Dt:
10/15/2001
SUGIMOTO, ARITOSHI
Exec Dt:
10/24/2001
TANAKA, MAKI
Exec Dt:
10/15/2001
MIYAI, HIROSHI
Exec Dt:
10/16/2001
KUNI, ASAHIRO
Exec Dt:
10/15/2001
NARA, YASUHIKO
Exec Dt:
10/16/2001
Assignee:
HITACHI, LTD.
6, KANDA SURUGADAI 4-CHOME, CHIYODA-KU
TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
ALAN E. SCHIAVELLI
1300 NORTH SEVENTEENTH STREET
SUITE 1800
ARLINGTON, VA 22209

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