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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
09/11/2007
Application #:
11076620
Filing Dt:
03/10/2005
Publication #:
Pub Dt:
10/06/2005
Inventors:
Wolfgang Vollrath, Thomas Krieg
Title:
APPARATUS AND METHOD FOR INSPECTING A SEMICONDUCTOR COMPONENT
Assignment: 1
Reel/Frame:
015961/0887Recorded: 04/29/2005Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/03/2005
Exec Dt:
03/07/2005
Assignee:
ERNST-LEITZ-STRASSE 17-37
WETZLAR, GERMANY D-35578
Correspondent:
HOUSTON ELISEEVA
4 MILITIA DRIVE, SUITE 4
LEXINGTON, MA 02421
Assignment: 2
Reel/Frame:
019676/0601Recorded: 08/01/2007Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/02/2006
Assignee:
KUBACHER WEG 4
WEILBURG, GERMANY D-35781
Correspondent:
MARIA ELISEEVA
HOUSTON ELISEEVA LLP
4 MILITIA DRIVE
SUITE 4
LEXINGTON, MA 02421

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