Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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09/18/2007
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Application #:
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11487504
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Filing Dt:
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07/17/2006
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Publication #:
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Pub Dt:
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10/04/2007
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Inventors:
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Hiroyuki Suto, Masahide Kanegae, Osamu Kawashima, Michihiko Umeda
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Title:
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METHOD OF TEST OF CLOCK GENERATION CIRCUIT IN ELECTRONIC DEVICE, AND ELECTRONIC DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU, KAWASAKI-SHI |
| KANAGAWA 211-8588, JAPAN |
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| ARMSTRONG, KRATZ, QUINTOS, ET AL |
| 1725 K STREET, N.W., SUITE 1000 |
| WASHINGTON, D.C. 20006 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SHIBAURA 1-CHOME |
| MINATO-KU, TOKYO, JAPAN 105-8001 |
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| DAVID J. CUSHING |
| 2100 PENNSYLVANIA AVENUE, N.W. |
| WASHINGTON, DISTRICT OF COLUMBIA 20037 |
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