Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/25/2007
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Application #:
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11019238
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Filing Dt:
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12/23/2004
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Publication #:
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Pub Dt:
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03/02/2006
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Inventors:
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Hiroshi Miyake, Noriyuki Tokuhiro
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Title:
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SEMICONDUCTOR CIRCUIT, METHOD OF MONITORING SEMICONDUCTOR-CIRCUIT PERFORMANCE, METHOD OF TESTING SEMICONDUCTOR CIRCUIT, EQUIPMENT FOR TESTING SEMICONDUCTOR CIRCUIT, AND PROGRAM FOR TESTING SEMICONDUCTOR CIRCUIT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU |
| KAWASAKI-SHI, KANAGAWA 211-8588, JAPAN |
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| ARENT FOX PLLC |
| 1050 CONNECTICUT AVENUE, N.W., SUITE 400 |
| WASHINGTON, D.C. 20036-5339 |
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