Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/16/2007
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Application #:
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10175229
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Filing Dt:
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06/18/2002
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Inventors:
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David R. Bakker, Prashant A. Aji, James L. Belliveau, Chacko C. Neroth
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Title:
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APPARATUS AND METHODS FOR SEARCHING THROUGH AND ANALYZING DEFECT IMAGES AND WAFER MAPS
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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BEYER WEAVER & THOMAS, LLP |
P.O. BOX 778 |
BERKELEY, CA 94704-0778 |
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