Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/30/2007
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Application #:
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10936533
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Filing Dt:
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09/09/2004
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Publication #:
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Pub Dt:
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03/10/2005
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Inventor:
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Akimitsu Shimamura
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Title:
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METHOD OF TESTING SEMICONDUCTOR APPARATUS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1006, OAZA KADOMA |
| KADOMA-SHI, OSAKA, JAPAN 571-8501 |
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| MCDERMOTT WILL & EMERY LLP |
| 600 13TH STREET, N.W. |
| WASHINGTON, DC 20005-3096 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 10-23, SHINYOKOHAMA 2-CHOME, KOHOKU-KU, YOKOHAMA-SHI |
| KANAGAWA, JAPAN 2220033 |
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| PANASONIC CORPORATION |
| 2-1-61, SHIROMI, CHUO-KU |
| 7F OBP PANASONIC TOWER |
| OSAKA, 540-6207 JAPAN |
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