Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/25/2007
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Application #:
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11449197
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Filing Dt:
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06/08/2006
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Inventors:
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Sunhom Paak, Hsung Jai Im, Boon Yong Ang, Jan L. de Jong
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Title:
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TEST CIRCUIT AND METHOD OF USE THEREOF FOR THE MANUFACTURE OF INTEGRATED CIRCUITS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2100 LOGIC DRIVE |
| SAN JOSE, CALIFORNIA 95124 |
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| KIM KANZAKI |
| XILINX, INC. |
| 2100 LOGIC DRIVE |
| SAN JOSE, CA 95124 |
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