Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/04/2008
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Application #:
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11349076
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Filing Dt:
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02/08/2006
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Inventors:
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John Zhang, Kurt Taylor, Eugene Zhao, Amit Marathe, Joerg-Oliver Weidner et al
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Title:
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METHOD FOR DETERMINING PROJECTED LIFETIME OF SEMICONDUCTOR DEVICES WITH ANALYTICAL EXTENSION OF STRESS VOLTAGE WINDOW BY SCALING OF OXIDE THICKNESS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE AMD PLACE |
| P.O. BOX 3453 |
| SUNNYVALE, CALIFORNIA 94088-3453 |
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| MCDERMOTT WILL & EMERY LLP |
| 600 13TH STREET, N.W. |
| WASHINGTON, D.C. 20005-3096 |
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