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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7349575
Issue Dt:
03/25/2008
Application #:
10872035
Filing Dt:
06/18/2004
Publication #:
20040264759
Pub Dt:
12/30/2004
Inventors:
Shinichi Hattori, Tohru Ida, Shuzo Matsuno
Title:
PATTERN INSPECTION METHOD AND APPARATUS, AND PATTERN ALIGNMENT METHOD
Assignment: 1
Reel/Frame:
015500/0788Recorded: 06/18/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
HATTORI, SHINICHI
Exec Dt:
06/07/2004
IDA, TOHRU
Exec Dt:
06/07/2004
MATSUNO, SHUZO
Exec Dt:
06/07/2004
Assignee:
NIPPON AVIONICS CO. LTD.
20-1, NISHI-SHINBACHI 3-CHOME MINATO-KU
TOKYO, JAPAN
Correspondent:
BLAKELY, SOKOLOFF, TAYLOR ET AL.
GEORGE W. HOOVER
12400 WILSHIRE BOULEVARD
LOS ANGELES, CA 90025
Assignment: 2
Reel/Frame:
015682/0852Recorded: 02/14/2005Pages: 4
Conveyance:
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE ADDRESS, PTO ERROR PREVIOUSLY RECORDED ON REEL 015500 FRAME 0788. ASSIGNOR(S) HEREBY CONFIRMS THE APPLICATION FOR U.S. LETTERS PATENT.
Assignors:
HATTORI, SHINICHI
Exec Dt:
06/07/2004
IDA, TOHRU
Exec Dt:
06/07/2004
MATSUNO, SHUZO
Exec Dt:
06/07/2004
Assignee:
NIPPON AVIONICS CO., LTD.
20-1, NISHI-SHINBASHI 3-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
BLAKELY SOKOLOFF TAYLOR & ZAFMAN
12400 WILSHIRE BOULEVARD, 7TH FLOOR
LOS ANGELES, CA 90025

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