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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/06/2008
Application #:
10718126
Filing Dt:
11/19/2003
Publication #:
Pub Dt:
08/05/2004
Inventors:
Mehrdad Nikoonahad, Shing Lee, Hidong Kwak, Sergio Edelstein, Guoheng Zhao, Gary Janik
Title:
OPTICAL SYSTEM FOR MEASURING SAMPLES USING SHORT WAVELENGTH RADIATION
Assignment: 1
Reel/Frame:
014531/0433Recorded: 04/19/2004Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/09/2004
Exec Dt:
02/24/2004
Exec Dt:
03/22/2004
Exec Dt:
03/10/2004
Exec Dt:
02/23/2004
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95045
Correspondent:
PARSONS HSUE & DE RUNTZ LLP
JAMES S. HSUE
655 MONTGOMERY STREET
SUITE 1800
SAN FRANCISCO, CA 94111

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