Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/26/2008
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Application #:
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11746884
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Filing Dt:
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05/10/2007
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Inventors:
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Paul Sullivan, George Kren, Eliezer Rosengaus, Yan Xiong, Robinson Piramuthu et al
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Title:
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WAFER INSPECTION SYSTEMS AND METHODS FOR ANALYZING INSPECTION DATA
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| BAKER & MCKENZIE LLP |
| 1114 AVENUE OF THE AMERICAS |
| NEW YORK, NY 10036 |
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