Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/30/2008
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Application #:
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11359100
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Filing Dt:
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02/22/2006
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Publication #:
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Pub Dt:
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02/01/2007
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Inventors:
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Ron Naftali, Yoram Uziel, Ran Vered, Eitan Pinhasi, Igor Krivts (Krayvitz)
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Title:
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INTEGRATED IN SITU SCANNING ELECTRONIC MICROSCOPE REVIEW STATION IN SEMICONDUCTOR WAFERS AND PHOTOMASKS OPTICAL INSPECTION SYSTEM
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 9 OPPENHEIMER ST. |
| REHOVOT, ISRAEL 76236 |
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| TAREK N. FAHMI |
| P.O. BOX 061080 |
| WACKER DRIVE STATION, SEARS TOWER |
| CHICAGO, IL 60606-1080 |
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