Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/14/2008
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Application #:
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11459359
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Filing Dt:
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07/23/2006
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Publication #:
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Pub Dt:
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11/15/2007
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Inventors:
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Cheng-Hsun Nien, Chuen-Horng Tsai, Kun-Ying Shin, Wen-Bin Jian
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Title:
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ELECTRON MICROSCOPE, METHODS TO DETERMINE THE CONTACT POINT AND THE CONTACT OF THE PROBE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 300, JUNGDA RD., JUNGLI CITY, |
| TAOYUAN, TAIWAN 320 |
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| JIANQ CHYUN INTELLECTUAL PROPERTY OFFICE |
| 7 FLOOR-1, NO. 100 |
| ROOSEVELT ROAD, SECTION 2 |
| TAIPEI, TAIWAN 100 |
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