Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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11/04/2008
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Application #:
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10593830
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Filing Dt:
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09/22/2006
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Publication #:
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Pub Dt:
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08/02/2007
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Inventors:
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Hisao Igarashi, Kazuo Inoue, Katsumi Sato
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Title:
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PROBE APPARATUS,WAFER INSPECTING APPARATUS PROVIDED WITH THE PROBE APPARATUS AND WAFER INSPECTING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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6-10, TSUKIJI 5-CHOME, CHUO-KU |
TOKYO, JAPAN 104-0045 |
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OBLON, SPIVAK, ET AL. |
1940 DUKE STREET |
ALEXANDRIA, VA 22314 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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6F., 215, GALMACHI-RO, JUNGWON-GU |
SEONGNAM-SI, GYEONGGI-DO, KOREA, REPUBLIC OF 462-120 |
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RICHARD J. STREIT |
LADAS & PARRY, 224 SOUTH MICHIGAN AVE. |
CHICAGO, IL 60604 |
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