Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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12/30/2008
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Application #:
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11759050
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Filing Dt:
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06/06/2007
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Publication #:
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Pub Dt:
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10/04/2007
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Inventors:
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David Fong, Jianguo Wang, Jack Z. Peng, Harry S. Luan
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Title:
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MEMORY TRANSISTOR GATE OXIDE STRESS RELEASE AND IMPROVED RELIABILITY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2895 ZANKER ROAD |
| SAN JOSE, CALIFORNIA 95134 |
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| AKA CHAN LLP / GARY T. AKA |
| 900 LAFAYETTE STREET |
| SUITE 710 |
| SANTA CLARA, CA 95050 |
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Assignment:
2
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SECURITY INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3555 ALAMEDA DE LAS PULGAS, SUITE 208 |
| MENLO PARK, CALIFORNIA 94025 |
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| BUNNIE POULLARD |
| 9720 WILSHIRE BLVD |
| 5TH FLOOR |
| BEVERLY HILLS, CA 90212 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 690 EAST MIDDLEFIELD ROAD |
| MOUNTAIN VIEW, CALIFORNIA 94043 |
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| DOHYUN AHN |
| FENWICK & WEST LLP |
| 801 CALIFORNIA STREET |
| MOUNTAIN VIEW, CA 94041 |
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