Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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02/03/2009
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Application #:
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11607906
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Filing Dt:
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12/04/2006
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Publication #:
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Pub Dt:
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02/19/2009
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Inventors:
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Kenji Obara, Takehiro Hirai
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Title:
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INSPECTION METHOD FOR SEMICONDUCTOR WAFER AND APPARATUS FOR REVIEWING DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-24-14, NISHI SHIMBASHI, MINATO-KU |
TOKYO, JAPAN |
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MCDERMOTT WILL & EMERY LLP |
600 13TH STREET, N.W. |
WASHINGTON, DC 20005-3096 |
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