Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/07/2009
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Application #:
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11591794
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Filing Dt:
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11/01/2006
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Publication #:
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Pub Dt:
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03/27/2008
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Inventors:
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Hyun Seung Shin, Young Doo Kim, Yong Seok Kim, Sang-il Park
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Title:
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SCANNING PROBE MICROSCOPE FOR MEASURING ANGLE AND METHOD OF MEASURING A SAMPLE USING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 517-13 SANGDAEWON-DONG |
| JUNGWON-GU |
| SEONGNAM-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF |
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| OMKAR K. SURYADEVARA |
| SILICON VALLEY PATENT GROUP LLP |
| 2350 MISSION COLLEGE BOULEVARD |
| SUITE 360 |
| SANTA CLARA, CA 95054 |
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Assignment:
2
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CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
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| KANC 4F, IUI-DONG 906-10 |
| SUWON, KOREA, REPUBLIC OF 443-766 |
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| PATTERSON & SHERIDAN LLP |
| 3040 POST OAK BLVD |
| SUITE 1500 |
| HOUSTON, TX 77056 |
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