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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/14/2009
Application #:
11393074
Filing Dt:
03/30/2006
Publication #:
Pub Dt:
10/12/2006
Inventor:
Toshiyuki Sakamoto
Title:
SYSTEM AND METHOD FOR ANALYZING CROSSTALK OCCURRING IN A SEMICONDUCTOR INTEGRATED CIRCUIT
Assignment: 1
Reel/Frame:
017890/0614Recorded: 05/22/2006Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/13/2006
Assignee:
1-1, SHIBAURA 1-CHOME
MIANTO-KU, TOKYO 105-8001, JAPAN
Correspondent:
JON IKEGAMI
DLA PIPER RUDNICK GRAY CARY US LLP
2000 UNIVERSITY AVENUE
EAST PALO ALTO, CA 94303

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