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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
07/28/2009
Application #:
11500421
Filing Dt:
08/08/2006
Publication #:
Pub Dt:
03/29/2007
Inventors:
Yoshimasa Ohshima, Sachio Uto, Yukihiro Shibata
Title:
METHOD AND APPARATUS FOR DETECTING DEFECTS ON A WAFER
Assignment: 1
Reel/Frame:
018172/0631Recorded: 08/08/2006Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/07/2006
Exec Dt:
07/07/2006
Exec Dt:
07/07/2006
Assignee:
24-14, NISHINBASHI 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
ANTONELLI TERRY STOUT, ET AL.
1300 NORTH 17TH STREET
SUITE 1800
ARLINGTON, VA 22209
Assignment: 2
Reel/Frame:
023086/0040Recorded: 08/13/2009Pages: 3
Conveyance:
RE-RECORD TO CORRECT THE ADDRESS OF THE ASSIGNEE, PREVIOUSLY RECORDED ON REEL 018172 FRAME 0631.
Assignors:
Exec Dt:
07/07/2006
Exec Dt:
07/07/2006
Exec Dt:
07/07/2006
Assignee:
24-14, NISHISHINBASHI
MINATO-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH 17TH STREET - SUITE 1800
ARLINGTON, VIRGINIA 22209
Assignment: 3
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
Exec Dt:
02/12/2020
Assignee:
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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