Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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12/22/2009
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Application #:
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11850763
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Filing Dt:
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09/06/2007
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Publication #:
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Pub Dt:
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03/13/2008
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Inventors:
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Yoshimasa OGAWA, Kazuyuki KANEDA, Katsutoshi KABETA
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Title:
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MICROCHIP TESTING DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-1, OHTEMACHI 2-CHOME, CHIYODA-KU |
| TOKYO, JAPAN 100 |
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| DAVID S. SAFRAN |
| PO BOX 10064 |
| MCLEAN, VA 22102 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 21, SAIIN MIZOSAKI-CHO |
| UKYO-KU |
| KYOTO-SHI, KYOTO, JAPAN 615-8585 |
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| DAVID S. SAFRAN |
| PO BOX 10064 |
| MCLEAN, VA 22102 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2 MIYANOHIGASHI, KISSHOIN, |
| MINAMI-KU KYOTO, JAPAN 601-8510 |
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| CPA GLOBAL LIMITED |
| LIBERATION HOUSE |
| CASTLE STREET |
| ST HELIER, JE1 1BL JERSEY |
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