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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7644447
Issue Dt:
01/05/2010
Application #:
11601144
Filing Dt:
11/17/2006
Publication #:
20080078932
Pub Dt:
04/03/2008
Inventors:
Sang-il Park, Yong-Seok Kim, Jitae Kim, Sang Han Chung, Hyun-Seung Shin, Euichul Hwang et al
Title:
SCANNING PROBE MICROSCOPE CAPABLE OF MEASURING SAMPLES HAVING OVERHANG STRUCTURE
Assignment: 1
Reel/Frame:
018617/0223Recorded: 11/17/2006Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
PARK, SANG-IL
Exec Dt:
10/23/2006
KIM, YONG-SEOK
Exec Dt:
10/23/2006
KIM, JITAE
Exec Dt:
10/23/2006
CHUNG, SANG HAN
Exec Dt:
10/23/2006
SHIN, HYUN-SEUNG
Exec Dt:
10/23/2006
LEE, JUNG-ROK
Exec Dt:
10/23/2006
HWANG, EUICHUL
Exec Dt:
10/23/2006
Assignee:
PSIA CO., LTD.
517-13 SANGDAEWON-DONG, JUNGWON-GU, SEONGNAM-CITY
SEONGNAM-CITY, KYUNGKI-DO, KOREA, REPUBLIC OF
Correspondent:
OMKAR K. SURYADEVARA
SILICON VALLEY PATENT GROUP LLP
2350 MISSION COLLEGE BOULEVARD
SUITE 360
SANTA CLARA, CA 95054
Assignment: 2
Reel/Frame:
019551/0308Recorded: 07/12/2007Pages: 6
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
PSIA CO., LTD.
Exec Dt:
03/23/2007
Assignee:
PARK SYSTEMS CORP
KANC 4F, IUI-DONG 906-10
SUWON, KOREA, REPUBLIC OF 443-766
Correspondent:
PATTERSON & SHERIDAN LLP
3040 POST OAK BLVD
SUITE 1500
HOUSTON, TX 77056

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