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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7649978
Issue Dt:
01/19/2010
Application #:
12232259
Filing Dt:
09/12/2008
Publication #:
20090074141
Pub Dt:
03/19/2009
Inventors:
Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, David Berman, Dileep Agnihotri et al
Title:
AUTOMATED SELECTION OF X-RAY REFLECTOMETRY MEASUREMENT LOCATIONS
Assignment: 1
Reel/Frame:
021931/0655Recorded: 12/02/2008Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
MAZOR, ISAAC
Exec Dt:
11/25/2008
DIKOPOLTSEV, ALEX
Exec Dt:
11/19/2008
YOKHIN, BORIS
Exec Dt:
11/19/2008
AGNIHOTRI, DILEEP
Exec Dt:
11/11/2008
RAFAELI, TZACHI
Exec Dt:
11/19/2008
TOKAR, ALEX
Exec Dt:
11/16/2008
BERMAN, DAVID
Exec Dt:
11/17/2008
BEYLIN, MOSHE
Exec Dt:
11/17/2008
Assignee:
JORDAN VALLEY SEMICONDUCTORS LTD.
P.O. BOX 103
MIGDAL HAEMEK 23100, ISRAEL
Correspondent:
THOMAS H. JACKSON
SMITH, GAMBRELL & RUSSELL, LLP
1130 CONNECTICUT AVENUE
SUITE 1130
WASHINGTON, DC 20036
Assignment: 2
Reel/Frame:
056004/0248Recorded: 04/13/2021Pages: 8
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
JORDAN VALLEY SEMICONDUCTORS LTD.
Exec Dt:
07/18/2019
Assignee:
BRUKER TECHNOLOGIES LTD.
6 HAMECHKAR STREET
P.O. BOX 103
MIGDAL HAEMEK, ISRAEL 2306990
Correspondent:
KLIGLER & ASSOCIATES PATENT ATTORNEYS LTD.
P.O. BOX 57651
TEL AVIV, 6157601 ISRAEL

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