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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
01/26/2010
Application #:
11205194
Filing Dt:
08/17/2005
Publication #:
Pub Dt:
02/23/2006
Inventors:
Hiroyuki Takahashi, Atsushi Nakagawa, Takuya Kera, Masaki Miyata, Yasunari Kawaguchi et al
Title:
SEMICONDUCTOR MEMORY DEVICE, TEST CIRCUIT AND TEST METHOD
Assignment: 1
Reel/Frame:
016837/0924Recorded: 09/22/2005Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/28/2005
Exec Dt:
07/28/2005
Exec Dt:
07/28/2005
Exec Dt:
07/28/2005
Exec Dt:
07/28/2005
Exec Dt:
07/28/2005
Assignee:
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI
KANAGAWA, JAPAN 211-8668
Correspondent:
DAVID A. BLUMENTHAL
FOLEY & LARDNER LLP
WASHINGTON HARBOUR
3000 K STREET, N.W., SUITE 500
WASHINGTON, D.C. 20007-5143
Assignment: 2
Reel/Frame:
025346/0886Recorded: 11/11/2010Pages: 9
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/01/2010
Assignee:
1753 SHIMONUMABE, NAKAHARA-KU,
KAWASAKI-SHI, KANAGAWA, JAPAN 211-8668
Correspondent:
SUGHRUE MION, PLLC
2100 PENNSYLVANIA AVENUE, N.W.
SUITE 800
WASHINGTON, DC 20037
Assignment: 3
Reel/Frame:
044928/0001Recorded: 11/29/2017Pages: 235
Conveyance:
CHANGE OF ADDRESS
Assignor:
Exec Dt:
08/06/2015
Assignee:
2-24, TOYOSU 3-CHOME, KOUTOU-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR, PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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