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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/26/2010
Application #:
12213945
Filing Dt:
06/26/2008
Publication #:
Pub Dt:
01/01/2009
Inventors:
Joachim Baumann, Christian David, Martin Engelhardt, Jorg Freudenberger, Eckhard Hempel et al
Title:
MEASUREMENT SYSTEM AND METHOD FOR THE NONINVASIVE DETERMINATION OF PROPERTIES OF AN OBJECT TO BE EXAMINED AND CONTRAST MEDIUM FOR X-RAY PHASE-CONTRAST MEASUREMENT
Assignment: 1
Reel/Frame:
021315/0749Recorded: 07/24/2008Pages: 22
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
06/25/2008
Exec Dt:
07/01/2008
Exec Dt:
06/25/2008
Exec Dt:
06/24/2008
Exec Dt:
06/24/2008
Exec Dt:
06/24/2008
Exec Dt:
06/25/2008
Exec Dt:
06/27/2008
Exec Dt:
06/24/2008
Exec Dt:
06/24/2008
Exec Dt:
06/25/2008
Assignee:
WITTELSBACHERPLATZ 2
MUNICH, GERMANY D-80333
Correspondent:
HARNESS, DICKEY & PIERCE, P.L.C.
P.O. BOX 8910
RESTON, VA 20195
Assignment: 2
Reel/Frame:
039011/0386Recorded: 06/27/2016Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/10/2016
Assignee:
HENKESTR. 127
ERLANGEN, GERMANY 91052
Correspondent:
HARNESS, DICKEY & PIERCE, P.L.C.
P.O. BOX 8910
RESTON, VA 20195

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