Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/16/2010
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Application #:
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12345424
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Filing Dt:
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12/29/2008
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Inventors:
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Euo Chang JUNG, Hye-Ryun CHO, Kyoung Kyun PARK, Jei-Won YEON, Kyuseok SONG
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Title:
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APPARATUS FOR MEASURING MAGNITUDE OF DEFLECTED PROBE BEAM SIGNAL GENERATED BY LASER-INDUCED BREAKDOWN AND METHOD OF MEASURING SIZE OF NANOPARTICLES USING FREQUENCY DISTRIBUTION CURVE OF MAGNITUDE OF PROBE BEAM DEFLECTION SIGNAL
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1045 DAEDEOKDAERO |
| YUSEONG-GU |
| DAEJEON, KOREA, REPUBLIC OF 305-353 |
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| LAHIVE AND COCKFIELD, LLP |
| ONE POST OFFICE SQUARE |
| 30TH FLOOR |
| BOSTON, MA 02109 |
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