Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
03/16/2010
|
Application #:
|
11812774
|
Filing Dt:
|
06/21/2007
|
|
Publication #:
|
|
Pub Dt:
|
01/17/2008
| | | | |
|
Inventors:
|
Ryoichi Matsuoka, Hidetoshi Morokuma, Takumichi Sutani
|
|
Title:
|
SYSTEM AND METHOD FOR DETECTING DEFECTS IN A SEMICONDUCTOR DURING MANUFACTURING THEREOF
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 1-24-14, NISHI SHINBASHI, MINATO-KU |
| TOKYO, JAPAN |
|
|
|
|
| CROWELL AND MORING LLP |
| P.O. BOX 14300 |
| INTELLECTUAL PROPERTY GROUP |
| WASHINGTON, DC 20044-4300 |
|
|
Search Results as of:
04/28/2024 05:28 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
