Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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03/23/2010
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Application #:
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11031248
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Filing Dt:
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01/06/2005
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Inventor:
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Steven W. Meeks
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Title:
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MULTI-WAVELENGTH SYSTEM AND METHOD FOR DETECTING EPITAXIAL LAYER DEFECTS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| RICK BARNES |
| P.O. BOX 1871 |
| KNOXVILLE, TN 37901 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE TECHNOLOGY DRIVE |
| MILPITAS, CALIFORNIA 95035 |
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| ANDREW ISRAEL |
| FENWICK & WET LLP |
| SILICON VALLEY CENTER |
| 801 CALIFORNIA STREET |
| MOUNTAIN VIEW, CA 94041 |
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