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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
03/23/2010
Application #:
10698739
Filing Dt:
10/30/2003
Publication #:
Pub Dt:
01/27/2005
Inventors:
Wan-Pin Hung, David Huang, Peter Boyle, Qi Richard Chen, Kaiyu Ren, Adam J. Wright et al
Title:
FUNCTIONAL FAILURE ANALYSIS TECHNIQUES FOR PROGRAMMABLE INTEGRATED CIRCUITS
Assignment: 1
Reel/Frame:
014840/0928Recorded: 07/12/2004Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/20/2003
Exec Dt:
10/10/2003
Exec Dt:
10/28/2003
Exec Dt:
10/06/2003
Exec Dt:
10/06/2003
Exec Dt:
10/08/2003
Exec Dt:
10/23/2003
Exec Dt:
10/07/2003
Exec Dt:
10/08/2003
Exec Dt:
10/08/2003
Assignee:
101 INNOVATION DRIVE
SAN JOSE, CALIFORNIA 95134
Correspondent:
TOWNSEND AND TOWNSEND AND CREW LLP
STEVEN CAHILL
TWO EMBARCADERO CENTER, EIGHTH FLOOR
SAN FRANCISCO, CALIFORNIA 94111-3834

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