Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/06/2010
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Application #:
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11701379
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Filing Dt:
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02/02/2007
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Publication #:
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Pub Dt:
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08/09/2007
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Inventors:
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Shigekazu Komatsu, Takashi Amemiya, Jun Mochizuki
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Title:
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PROBE CARD AND PROBE DEVICE FOR INSPECTION OF A SEMICONDUCTOR DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3-6, AKASAKA 5-CHOME, MINATO-KU |
| TOKYO 107-8481, JAPAN |
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| MR. ERNEST F. CHAPMAN |
| FINNEGAN, HENDERSON, FARABOW, GARRETT |
| & DUNNER, L.L.P. |
| 901 NEW YORK AVE., N.W. |
| WASHINGTON, D.C. 20001-4413 |
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