Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/27/2010
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Application #:
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12388802
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Filing Dt:
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02/19/2009
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Publication #:
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Pub Dt:
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06/18/2009
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Inventors:
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Toshiaki Awaji, Takashi Sekino, Takayuki Nakamura
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Title:
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TEST APPARATUS AND TEST METHOD WITH FEATURES OF ADJUSTING PHASE DIFFERENCE BETWEEN DATA AND REFERENCE CLOCK AND ACQUIRING ADJUSTED DATA
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Assignment:
1
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1-6-2, MARUNOUCHI, CHIYODA-KU |
TOKYO, JAPAN 100-0005 |
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ADVANTEST C/O MURABITO HAO & BARNES LLP |
TWO NORTH MARKET STREET |
THIRD FLOOR |
SAN JOSE, CA 95113 |
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