Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/15/2010
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Application #:
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12115833
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Filing Dt:
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05/06/2008
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Publication #:
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Pub Dt:
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12/11/2008
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Inventors:
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David Alles, Mark Wihl, Stan Stokowski, Yalin Xiong, Damon Kvamme
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Title:
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METHODS FOR DETECTING AND CLASSIFYING DEFECTS ON A RETICLE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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160 RIO ROBLES |
SAN JOSE, CALIFORNIA 95134 |
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BAKER & MCKENZIE LLP |
1114 AVENUE OF THE AMERICAS |
NEW YORK, NY 10036 |
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