Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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06/22/2010
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Application #:
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12187868
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Filing Dt:
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08/07/2008
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Publication #:
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Pub Dt:
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02/19/2009
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Inventors:
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Tomohiro TSUTSUI, Ryoji Yoshikawa, Osamu Ikenaga
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Title:
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MASK DEFECT INSPECTION DATA GENERATING METHOD, MASK DEFECT INSPECTION METHOD AND MASK PRODUCTION METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1-1, SHIBAURA 1-CHOME, MINATO-KU |
TOKYO 105-8001, JAPAN |
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ERNEST F. CHAPMAN |
FINNEGAN, HENDERSON, FARABOW, GARRETT |
& DUNNER, L.L.P. |
901 NEW YORK AVENUE, NW |
WASHINGTON, D.C. 20001-4413 |
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