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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/27/2010
Application #:
12067381
Filing Dt:
03/19/2008
Publication #:
Pub Dt:
07/16/2009
Inventors:
Takashi Fujii, Naohiko Goto, Megumi Miki, Takuya Nayuki, Koshichi Nemoto, Nobuyuki Tanaka
Title:
FINE PARTICLE CONSTITUENT MEASURING METHOD AND FINE-PARTICLE CONSTITUENT MEASURING APPARATUS
Assignment: 1
Reel/Frame:
020674/0303Recorded: 03/19/2008Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/11/2008
Exec Dt:
03/11/2008
Exec Dt:
03/11/2008
Exec Dt:
03/11/2008
Exec Dt:
03/11/2008
Exec Dt:
03/11/2008
Assignee:
6-1, OTEMACHI, 1-CHOME
CHIYODA-KU, TOKYO, JAPAN 100-8126
Correspondent:
NOTARO AND MICHALOS
100 DUTCH HILL ROAD
SUITE 110
ORANGEBURG, NY 10962-2100

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