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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
08/10/2010
Application #:
12037687
Filing Dt:
02/26/2008
Publication #:
Pub Dt:
08/27/2009
Inventors:
Richard L. Guldi, Toan Tran, Deepak A. Ramappa
Title:
STRUCTURES FOR TESTING AND LOCATING DEFECTS IN INTEGRATED CIRCUITS
Assignment: 1
Reel/Frame:
020572/0715Recorded: 02/27/2008Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/16/2008
Exec Dt:
02/22/2008
Exec Dt:
02/25/2008
Assignee:
7839 CHURCHILL WAY
MS 3999
DALLAS, TEXAS 75251
Correspondent:
TEXAS INSTRUMENTS INCORPORATED
P O BOX 655474, M/S 3999
DALLAS, TX 75265

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