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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/28/2010
Application #:
11583758
Filing Dt:
10/19/2006
Inventors:
Biju Parameshwaran, Sriram Madhavan, Andrew E. Carlson
Title:
TEST DEVICE FOR DETERMINING CHARGE DAMAGE TO A TRANSISTOR
Assignment: 1
Reel/Frame:
018447/0621Recorded: 10/19/2006Pages: 7
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/12/2006
Exec Dt:
10/12/2006
Exec Dt:
10/12/2006
Assignee:
ONE AMD PLACE, P.O. BOX 3453
SUNNYVALE, CALIFORNIA 94088-3453
Correspondent:
MICHAEL FARJAMI, ESQ.
FARJAMI & FARJAMI LLP
26522 LA ALAMEDA AVE.
SUITE 360
MISSION VIEJO, CA 92691

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