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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
7846642
Issue Dt:
12/07/2010
Application #:
12193437
Filing Dt:
08/18/2008
Publication #:
20090047485
Pub Dt:
02/19/2009
Inventors:
Yuval Ofir, Vincent Martin Rotello, Mark Thomas Tuominen, Qijun Xiao et al
Title:
DIRECT INCIDENT BEAM LITHOGRAPHY FOR PATTERNING NANOPARTICLES, AND THE ARTICLES FORMED THEREBY
Assignment: 1
Reel/Frame:
021700/0967Recorded: 10/20/2008Pages: 2
Conveyance:
EXECUTIVE ORDER 9424, CONFIRMATORY LICENSE
Assignor:
AMHERST, UNIVERSITY OF MASSACHUSETTS
Exec Dt:
08/29/2008
Assignee:
NATIONAL SCIENCE FOUNDATION
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VIRGINIA 22230
Correspondent:
FAITH E HIXSON
4201 WILSON BLVD
ROOM 1265
ARLINGTON, VA 22230
Assignment: 2
Reel/Frame:
021524/0479Recorded: 09/12/2008Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
OFIR, YUVAL
Exec Dt:
09/05/2008
ROTELLO, VINCENT MARTIN
Exec Dt:
09/09/2008
TUOMINEN, MARK THOMAS
Exec Dt:
09/09/2008
XIAO, QIJUN
Exec Dt:
09/09/2008
SAMANTA, BAPPADITYA
Exec Dt:
09/05/2008
Assignee:
THE UNIVERSITY OF MASSACHUSETTS
225 FRANKLIN STREET
BOSTON, MASSACHUSETTS 02110
Correspondent:
CANTOR COLBURN LLP
20 CHURCH STREET
22ND FLOOR
HARTFORD, CT 06103

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