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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
04/12/2011
Application #:
11645616
Filing Dt:
12/27/2006
Publication #:
Pub Dt:
06/28/2007
Inventors:
Toshiyuki Matsumoto, Tomohide Minami
Title:
TEMPERATURE MEASURING DEVICE AND METHOD FOR MEASURING WAFER-TYPE THERMOMETERS
Assignment: 1
Reel/Frame:
024428/0350Recorded: 05/24/2010Pages: 6
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/26/2007
Exec Dt:
02/26/2007
Assignee:
3-6, AKASAKA 5-CHOME
MINATO-KU, TOKYO, JAPAN 107-8481
Correspondent:
FINNEGAN, HENDERSON, FARABOW, GARRETT &
901 NEW YORK AVENUE, NW
WASHINGTON, DC 20001-4413
Assignment: 2
Reel/Frame:
024466/0521Recorded: 05/24/2010Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/26/2007
Exec Dt:
02/26/2007
Assignee:
3-6, AKASAKA 5-CHOME
MINATO-KU, TOKYO, JAPAN 107-8481
Correspondent:
DAVID W. HILL
FINNEGAN, HENDERSON, FARABOW ET AL.
901 NEW YORK AVENUE, N.W.
WASHINGTON, D.C. 20001-4413

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