Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
07/19/2011
|
Application #:
|
12222992
|
Filing Dt:
|
08/21/2008
|
|
Publication #:
|
|
Pub Dt:
|
03/05/2009
| | | | |
|
Inventors:
|
Yuzo Takamatsu, Hiroshi Takahashi, Yoshinobu Higami, Hideo Ohmae, Michinobu Nakao et al
|
|
Title:
|
FAULT TEST APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR DEVICE UNDER TEST USING FAULT EXCITATION FUNCTION
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 3-17-2, SHIN-YOKOHAMA, KOHOKU-KU |
| YOKOHAMA-SHI, KANAGAWA 222-0033, JAPAN |
|
|
|
|
| WENDEROTH, LIND & PONACK, L.L.P. |
| ATTN: MICHAEL S. HUPPERT, ESQ. |
| 2033 K STREET, N.W., SUITE 800 |
| WASHINGTON, DC 20006-1021 |
|
|
Search Results as of:
04/27/2024 08:49 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
