Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
1
|
|
Patent #:
|
|
Issue Dt:
|
07/26/2011
|
Application #:
|
11763448
|
Filing Dt:
|
06/15/2007
|
|
Publication #:
|
|
Pub Dt:
|
02/28/2008
| | | | |
|
Inventors:
|
Kazuhiro Fujita, Masakatsu Suda, Takuya Hasumi
|
|
Title:
|
DELAY CIRCUIT, TEST APPARATUS, STORAGE MEDIUM SEMICONDUCTOR CHIP, INITIALIZING CIRCUIT AND INITIALIZING METHOD
|
|
|
Assignment:
1
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 1-32-1, ASAHI-CHO, NERIMA-KU |
| TOKYO, JAPAN 179-0071 |
|
|
|
|
| JIANQ CHYUN INTELLECTUAL PROPERTY |
| 7F-1, NO.100, ROOSEVELT RD., SEC.2 |
| TAIPEI, 100 TAIWAN |
|
|
Search Results as of:
04/29/2024 01:07 AM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
