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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	8026481	Issue Dt:	09/27/2011	Application #:	11700838	Filing Dt:	02/01/2007
Publication #:	20070181807	Pub Dt:	08/09/2007
Inventors:	Muneyuki Fukuda, Tomoyasu Shojo, Atsuko Fukada, Noritsugu Takahashi
Title:	CHARGED PARTICLE APPARATUS, SCANNING ELECTRON MICROSCOPE, AND SAMPLE INSPECTION METHOD

Assignment: 1

Reel/Frame:

018965/0807

Recorded: 02/01/2007

Pages: 2

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

FUKUDA, MUNEYUKI

Exec Dt:

12/19/2006

SHOJO, TOMOYASU

Exec Dt:

12/19/2006

FUKADA, ATSUKO

Exec Dt:

12/18/2006

TAKAHASHI, NORITSUGU

Exec Dt:

12/19/2006

Assignee:

HITACHI HIGH-TECHNOLOGIES CORPORATION

24-14, NISHISHINBASHI 1-CHOME, MINATO-KU

TOKYO, JAPAN

Correspondent:

MATTINGLY, STANGER, MALUR & ET AL

1800 DIAGONAL ROAD, SUITE 370

ALEXANDRIA, VIRGINIA 22314

Assignment: 2

Reel/Frame:

021757/0901

Recorded: 10/29/2008

Pages: 4

Conveyance:

CORRECTIVE ASSIGNMENT TO CORRECT THE EXECUTION DATE OF THE THIRD INVENTOR PREVIOUSLY RECORDED ON REEL 018965 FRAME 0807. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT TO HITACHI HIGH-TECHNOLOGIES CORPORATION.

Assignors:

FUKUDA, MUNEYUKI

Exec Dt:

12/19/2006