Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/18/2011
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Application #:
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12281623
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Filing Dt:
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10/31/2008
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Publication #:
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Pub Dt:
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03/12/2009
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Inventors:
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Terutaka Goto, Yuichi Nemoto, Masataka Hourai, Hiroshi Kaneta
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Title:
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QUANTITATIVE EVALUATION DEVICE AND METHOD OF ATOMIC VACANCY EXISTING IN SILICON WAFER
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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8050, IKARASHI NINOCHO, NIIGATA-SHI |
NIIGATA, JAPAN 950-2181 |
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2-1, SHIBAURA 1-CHOME, MINATO-KU |
TOKYO, JAPAN 105-8634 |
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SUGHRUE MION, PLLC |
2100 PENNSYLVANIA AVENUE, N.W. |
SUITE 800 |
WASHINGTON, DC 20037 |
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