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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
8068579
Issue Dt:
11/29/2011
Application #:
12421380
Filing Dt:
04/09/2009
Inventors:
Wenbing Yun, Michael Feser, Andrei Tkachuk, Thomas A. Case, Frederick W. Duewer et al
Title:
PROCESS FOR EXAMINING MINERAL SAMPLES WITH X-RAY MICROSCOPE AND PROJECTION SYSTEMS
Assignment: 1
Reel/Frame:
023314/0983Recorded: 10/01/2009Pages: 10
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
YUN, WENBING
Exec Dt:
09/11/2009
FESER, MICHAEL
Exec Dt:
09/22/2009
TKACHUK, ANDREI
Exec Dt:
09/16/2009
CASE, THOMAS A.
Exec Dt:
09/14/2009
DUEWER, FREDERICK W.
Exec Dt:
09/30/2009
CHANG, HAUYEE
Exec Dt:
09/14/2009
Assignee:
XRADIA, INC.
5052 COMMERCIAL CIRCLE
CONCORD, CALIFORNIA 94520
Correspondent:
J. GRANT HOUSTON
4 MILITIA DRIVE
SUITE 4
LEXINGTON, MA 02421
Assignment: 2
Reel/Frame:
031938/0108Recorded: 01/10/2014Pages: 9
Conveyance:
MERGER (SEE DOCUMENT FOR DETAILS).
Assignor:
XRADIA, INC.
Exec Dt:
07/12/2013
Assignee:
CARL ZEISS X-RAY MICROSCOPY, INC.
4385 HOPYARD ROAD
SUITE 100
PLEASANTON, CALIFORNIA 94588
Correspondent:
J. GRANT HOUSTON
HOUSTON & ASSOCIATES, LLP
420 BEDFORD STREET SUITE 155
LEXINGTON, MA 02420

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