Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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03/20/2012
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Application #:
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12374775
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Filing Dt:
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01/22/2009
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Publication #:
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Pub Dt:
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01/07/2010
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Inventors:
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Tomonobu Nakayama, Seiji Higuchi
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Title:
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SCANNING PROBE MICROSCOPE AND A METHOD TO MEASURE RELATIVE POSITION BETWEEN PROBES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-1, SENGEN 1-CHOME, TSUKUBA-SHI |
| IBARAKI, JAPAN |
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| 2, MIYANOHIGASHI-CHO, KISSHOIN, MINAMI-KU |
| KYOTO-CITY, KYOTO, JAPAN |
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| JOSEPH W. PRICE |
| 600 ANTON BOULEVARD, SUITE 1400 |
| COSTA MESA, CA 92626 |
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