Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/29/2012
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Application #:
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12184657
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Filing Dt:
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08/01/2008
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Publication #:
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Pub Dt:
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02/05/2009
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Inventor:
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Yasuhiko OZAWA
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Title:
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SCANNING ELECTRON MICROSCOPE FOR DETERMINING QUALITY OF A SEMICONDUCTOR PATTERN
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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24-14 NISHISHINBASHI 1-CHOME, MINATO-KU, |
TOKYO, JAPAN |
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MCDERMOTT WILL & EMERY LLP |
600 13TH STREET, N.W. |
WASHINGTON, DC 20005-3096 |
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