Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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04/30/2013
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Application #:
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12602144
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Filing Dt:
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12/24/2009
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Publication #:
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Pub Dt:
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06/24/2010
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Inventor:
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Mitsuo Matsumoto
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Title:
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SEMICONDUCTOR TEST APPARATUS AND TEST METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-32-1, ASAHI-CHO, NERIMA-KU |
| TOKYO, JAPAN 179-0071 |
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| LADAS & PARRY LLP (VY) |
| 5670 WILSHIRE BOULEVARD, SUITE 2100 |
| LOS ANGELES, CA 90036-5679 |
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Assignment:
2
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| 1-6-2, MARUNOUCHI, CHIYODA-KU |
| TOKYO, JAPAN 100-0005 |
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| ADVANTEST C/O MURABITO HAO & BARNES LLP |
| TWO NORTH MARKET STREET |
| THIRD FLOOR |
| SAN JOSE, CA 95113 |
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