Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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05/14/2013
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Application #:
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12810877
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Filing Dt:
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07/20/2010
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Publication #:
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Pub Dt:
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11/11/2010
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Inventors:
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Koichiro Noguchi, Yoshio Kameda, Koichi Nose, Masayuki Mizuno, Toshinobu Ono
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Title:
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SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, SHIBA 5-CHOME, MINATO-KU |
| TOKYO, JAPAN 108-8001 |
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| 1753, SHIMONUMABE, NAKAHARA-KU, KAWASAKI-SHI |
| KANAGAWA, JAPAN 211-8668 |
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| YOUNG & THOMPSON |
| 209 MADISON STREET |
| SUITE 500 |
| ALEXANDRIA, VA 22314 |
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