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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
05/28/2013
Application #:
12650257
Filing Dt:
12/30/2009
Publication #:
Pub Dt:
06/30/2011
Inventors:
Ravi Shankar, Olivier Le Neel
Title:
DEVICE AND METHOD FOR TESTING MAGNETIC SWITCHES AT WAFER-LEVEL STAGE OF MANUFACTURE
Assignment: 1
Reel/Frame:
024217/0321Recorded: 04/12/2010Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
04/07/2010
Exec Dt:
04/07/2010
Assignee:
5A SERANGOON NORTH AVENUE 5
SINGAPORE, SINGAPORE 554574
Correspondent:
HAROLD H. BENNETT II
701 FIFTH AVENUE
SUITE 5400
SEATTLE, WA 98104
Assignment: 2
Reel/Frame:
027088/0659Recorded: 10/19/2011Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
09/05/2011
Exec Dt:
09/05/2011
Assignee:
28 ANG MO KIO INDUSTRIAL PARK 2
SINGAPORE, SINGAPORE 569508
Correspondent:
HAYLEY J. STEVENS
701 FIFTH AVENUE
SUITE 5400
SEATTLE, WA 98104
Assignment: 3
Reel/Frame:
027088/0653Recorded: 10/19/2011Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
10/04/2011
Assignee:
28 ANG MO KIO INDUSTRIAL PARK 2
SINGAPORE, SINGAPORE 569508
Correspondent:
HAYLEY J. STEVENS
701 FIFTH AVENUE
SUITE 5400
SEATTLE, WA 98104

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