Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/17/2013
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Application #:
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12865201
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Filing Dt:
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07/29/2010
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Publication #:
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Pub Dt:
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12/23/2010
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Inventors:
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Yoshio Kameda, Masamoto Tago, Yoshihiro Nakagawa, Koichiro Noguchi
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Title:
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SEMICONDUCTOR INSPECTING DEVICE AND SEMICONDUCTOR INSPECTING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-1, SHIBA 5-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| KEN SATO |
| 6535 N. STATE HWY 161 |
| IRVING, TX 75039 |
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