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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
10/15/2013
Application #:
12078097
Filing Dt:
03/27/2008
Publication #:
Pub Dt:
10/02/2008
Inventors:
Koji Kawaki, Atsushi Takane, Hiroshi Kikuchi, Nobuhiro Obara, Yuji Inoue
Title:
Defect inspection apparatus and method utilizing multiple inspection conditions
Assignment: 1
Reel/Frame:
020754/0810Recorded: 03/27/2008Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/04/2008
Exec Dt:
02/04/2008
Exec Dt:
02/04/2008
Exec Dt:
02/04/2008
Exec Dt:
02/04/2008
Assignee:
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MCDERMOTT WILL & EMERY LLP
600 13TH STREET, NW
WASHINGTON, DC 20005-3096
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
Exec Dt:
02/12/2020
Assignee:
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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