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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
12/03/2013
Application #:
12994579
Filing Dt:
01/28/2011
Publication #:
Pub Dt:
05/26/2011
Inventors:
Yoshiharu Umemura, Kensuke Kato, Yoshirou Nakata, Naomi Miyake
Title:
PROBE, ELECTRONIC DEVICE TEST APPARATUS, AND METHOD OF PRODUCING THE SAME
Assignment: 1
Reel/Frame:
025709/0831Recorded: 01/28/2011Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
01/17/2011
Exec Dt:
01/12/2011
Exec Dt:
12/10/2010
Exec Dt:
12/10/2010
Assignees:
32-1 ASAHI-CHO 1-CHOME, NERIMA-KU
TOKYO, JAPAN 179-0071
1006, OAZA KADOMA, KADOMA-SHI
OSAKA, JAPAN 571-8501
Correspondent:
GREENBLUM & BERNSTEIN, P.L.C.
1950 ROLAND CLARKE PLACE
RESTON, VA 20191

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